The 2nd eyefortransport Hi-Tech & Electronics Supply Chain Summit

The 2nd eyefortransport Hi-Tech & Electronics Supply Chain Summit is an exclusive, executive-level event specifically designed to address the needs and interests of the Hi-Tech & Electronics Industry.  Uniquely, this event offers complimentary passes to qualified executives.

The Summit is completely industry led bringing together top supply chain executives from Fortune 500 companies to discuss the tips, tricks and best practices for achieving lean, effective, low-cost supply chains.

Hear industry experts share their experience:

How to reinvigorate your supply chain management
Best practices for outsourcing
Streamlining your aftermarket supply chain
How to operate efficiently on a global scale
Managing your 3PL relationship
How the Restriction of Hazardous Substances (RoHS) effects Waste Electrical and Electronic Equipment (WEEE), and its impact on your supply chain
Benefit from low-cost country sourcing and near-shoring
How to classify your inventory criticality
Bottom line results of greening your supply chain
Which technologies create real results  

Keynote speeches, panel discussions, case studies and 1-to-1 meetings all provide an invaluable resource for supply chain and logistics professionals.

Heres a sample of top supply chain executives speaking at the Summit:

Hugh Aitken VP European Operations Sun Microsystems
Maurits Matthijsse Logistics Director Europe Samsung Electronics
Stef van Haaren Supply Chain & Logistics Manager Nikon Europe
Dave Williams Director of Manufacturing EMEA Microsoft
Eyal Knoll Senior Manager Service Operations Emerging Markets East Cisco
Jonathan Perry Take Back Compliance Manager Dell
Christian Verstraete Solutions & Technology Integration Manufacturing & Distribution Industry Hewlett Packard
Jean Michel Fallet SVP Supply Chain Operations Schneider Electric
Dick Onnink Supply Chain Solutions Manager Getronics
Christian Wolf Director Global Logistics and Trade Compliance Avatech  

To learn more about the Summit, visit:

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